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Technical Program

Paper Detail

Paper IDD5-S1-T4.2
Paper Title Correctable Erasure Patterns in Product Topologies
Authors Lukas Holzbaur, Technical University of Munich, Germany; Sven Puchinger, Technical University of Denmark, Denmark; Eitan Yaakobi, Technion - Israel Institute of Technology, Israel; Antonia Wachter-Zeh, Technical University of Munich, Germany
Session D5-S1-T4: Erasure Correction
Chaired Session: Friday, 16 July, 22:00 - 22:20
Engagement Session: Friday, 16 July, 22:20 - 22:40
Abstract Locality enables storage systems to recover failed nodes from small subsets of surviving nodes. The setting where nodes are partitioned into subsets, each allowing for local recovery, is well understood. In this work we consider a generalization introduced by Gopalan et al., where, viewing the codewords as arrays, constraints are imposed on the columns and rows in addition to some global constraints. Specifically, we present a generic method of adding such global parity-checks and derive new results on the set of correctable erasure patterns. Finally, we relate the set of correctable erasure patterns in the considered topology to those correctable in tensor-product codes.